SBAS888A December 2020 – August 2021
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | NOM | MAX | UNIT | |
---|---|---|---|---|---|---|
ADC Timing Specifications | ||||||
tAD | Aperture Delay | 0.85 | ns | |||
tA | Aperture Jitter | square wave clock with fast edges | 250 | fs | ||
tJ | Jitter on DCLKIN | ± 50 | ps | |||
Recory time from +6 dB overload condition | SNR within 1 dB of expected value | 1 | Clock cycle | |||
tACQ | Signal acquisition period | referenced to sampling clock falling edge | -TS/4 | Sampling clock period | ||
tCONV | Signal conversion period | 6 | ns | |||
Wake up time | Time to valid data after coming out of power down. Internal reference. | Bandgap reference enabled, single ended clock | 13 | us | ||
Bandgap reference enabled, differential clock | 15 | |||||
Bandgap reference disabled, single ended clock | 2.4 | ms | ||||
Bandgap reference disabled, differential clock | 2.3 | |||||
Time to valid data after coming out of power down. External 1.6V reference. |
Bandgap reference enabled, single ended clock | 13 | us | |||
Bandgap reference enabled, differential clock | 14 | |||||
Bandgap reference disabled, single ended clock | 2.0 | ms | ||||
Bandgap reference disabled, differential clock | 2.2 | |||||
tS,SYNC | Setup time for SYNC input signal | Referenced to sampling clock rising edge | 500 | ps | ||
tH,SYNC | Hold time for SYNC input signal | 600 | ||||
ADC Latency | Signal input to data output | 1/2-wire SLVDS | 1 | Clock cycles | ||
1-wire SLVDS | 1 | |||||
2-wire SLVDS | 2 | |||||
Add. Latency | Real decimation by 2 | 21 | Output clock cycles | |||
Complex decimation by 2 | 22 | |||||
Real or complex decimation by 4, 8, 16, 32 | 23 | |||||
Interface Timing: Serial LVDS Interface | ||||||
tPD | Propagation delay: sampling clock falling edge to DCLK rising edge | Delay between sampling clock falling edge to DCLKIN falling edge < 2.5ns. TDCLK = DCLK period tCDCLK = Sampling clock falling edge to DCLKIN falling edge |
2 + TDCLK + tCDCLK |
3 + TDCLK + tCDCLK |
4 + TDCLK + tCDCLK |
ns |
Delay between sampling clock falling edge to DCLKIN falling edge >= 2.5ns. TDCLK = DCLK period tCDCLK = Sampling clock falling edge to DCLKIN falling edge |
2 + tCDCLK |
3 + tCDCLK |
4 + tCDCLK |
|||
tCD | DCLK rising edge to output data delay, 2-wire SLVDS, 14-bit |
Fout = 65 MSPS, DA/B0,1 = 455 MBPS | 0 | 0.1 | ns | |
Fout = 80 MSPS, DA/B0,1 = 560 MBPS | 0 | 0.1 | ||||
Fout = 125 MSPS, DA/B0,1 = 875 MBPS | -0.2 | 0.1 | ||||
DCLK rising edge to output data delay, 1-wire SLVDS, 14-bit |
Fout = 65 MSPS, DA/B0 = 910 MBPS | 0 | 0.1 | |||
DCLK rising edge to output data delay, 1-wire SLVDS, 16-bit |
Fout = 10 MSPS, DA/B0 = 160 MBPS | 0 | 0.1 | |||
Fout = 25 MSPS, DA/B0 = 400 MBPS | 0 | 0.1 | ||||
Fout = 62.5 MSPS, DA/B0= 1000 MBPS | -0.6 | 0.1 | ||||
DCLK rising edge to output data delay, 1/2-wire SLVDS, 16-bit |
Fout = 5 MSPS, DA0 = 160 MBPS | 0 | 0.1 | |||
Fout = 10 MSPS, DA0 = 320 MBPS | 0 | 0.1 | ||||
Fout = 25 MSPS, DA0 = 800 MBPS | 0 | 0.1 | ||||
tDV | Data valid, 2-wire SLVDS, 14-bit | Fout = 65 MSPS, DA/B0,1 = 455 MBPS | 1.8 | 1.9 | ns | |
Fout = 80 MSPS, DA/B0,1 = 560 MBPS | 1.4 | 1.5 | ||||
Fout = 125 MSPS, DA/B0,1 = 875 MBPS | 0.6 | 0.8 | ||||
Data valid, 1-wire SLVDS, 14-bit | Fout = 65 MSPS, DA/B0 = 910 MBPS | 0.6 | 0.8 | |||
Data valid, 1-wire SLVDS, 16-bit | Fout = 10 MSPS, DA/B0 = 160 MBPS | 5.7 | 5.8 | |||
Fout = 25 MSPS, DA/B0 = 400 MBPS | 2.0 | 2.1 | ||||
Fout = 62.5 MSPS, DA/B0= 1000 MBPS | 0.5 | 0.6 | ||||
Data valid, 1/2-wire SLVDS, 16-bit | Fout = 5 MSPS, DA0 = 160 MBPS | 5.7 | 5.8 | |||
Fout = 10 MSPS, DA0 = 320 MBPS | 2.7 | 2.8 | ||||
Fout = 25 MSPS, DA0 = 800 MBPS | 0.8 | 0.9 | ||||
SERIAL PROGRAMMING INTERFACE (SCLK, SEN, SDIO) - Input | ||||||
fCLK,SCLK | Serial clock frequency | 20 | MHz | |||
tS,SEN | SEN falling edge to SCLK rising edge | 10 | ns | |||
tH,SEN | SCLK rising edge to SEN rising edge | 9 | ||||
tS,SDIO | SDIO setup time from rising edge of SCLK | 17 | ||||
tH,SDIO | SDIO hold time from rising edge of SCLK | 9 | ||||
SERIAL PROGRAMMING INTERFACE (SDIO) - Output | ||||||
tOZD | Delay from falling edge of 16th SCLK cycle during read operation for SDIO transition from tri-state to valid data | 3.9 | 10.8 | ns | ||
tODZ | Delay from SEN rising edge for SDIO transition from valid data to tri-state | 3.4 | 14 | |||
tOD | Delay from falling edge of 16th SCLK cycle during read operation to SDIO valid | 3.9 | 10.8 |