SBOA387A March 2020 – April 2022 INA186-Q1
The failure mode distribution estimation for INA186-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| OUT open (Hi-Z) | 10% |
| OUT to GND | 20% |
| OUT to VS | 15% |
| OUT functional, not in specification | 50% |
| Pin to pin short, any two pins | 5% |