SBOA387A March 2020 – April 2022 INA186-Q1
This section provides a Failure Mode Analysis (FMA) for the pins of the INA186-Q1 (DCK-6, DBV-5, and DDF-8 package). The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-6 through Table 4-13 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section: