SBOA413 September 2020 – MONTH TLV2314-Q1
4 Pin Failure Mode Analysis (Pin FMA)
This section provides a Failure Mode Analysis (FMA) for the pins of the TLV2314-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
- Pin short-circuited to Ground (see Table 4-2)
- Pin open-circuited (see Table 4-3)
- Pin short-circuited to an adjacent pin (see Table 4-4)
- Pin short-circuited to supply (see Table 4-5)
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
| Class | Failure Effects |
|---|---|
| A | Potential device damage that affects functionality |
| B | No device damage, but loss of functionality |
| C | No device damage, but performance degradation |
| D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the TLV2314-Q1 pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TLV2314-Q1 data sheet.
Figure 4-1 Pin DiagramFollowing are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Single-supply operation is used. For example, V+ = 5V and V- = 0V.
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
|
OUT A |
1 |
May cause device to overheat. |
B |
|
-IN A |
2 |
Input at V- (GND) is valid input, however, desired application result is unlikely. Output high if +IN A is greater than zero volts. |
C |
|
+IN A |
3 |
Input at V- (GND) is valid input, however, desired application result is unlikely. Output low if -IN A is greater than zero volts. |
C |
|
V- |
4 |
Normal operation, unless dual supply voltage was intended. |
D |
|
+IN B |
5 |
Input at V- (GND) is valid input, however, desired application result is unlikely. Output low if -IN B is greater than zero volts. |
C |
|
-IN B |
6 |
Input at V- (GND) is valid input, however, desired application result is unlikely. Output high if +IN B is greater than zero volts. |
C |
|
OUT B |
7 |
May cause device to overheat. |
B |
|
V+ |
8 |
Diodes from input to V+ may turn on due to input signal and cause electrical overstress (EOS). Main supply shorted. No power to device. |
B |
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
|
OUT A |
1 |
Output cannot be used by application. |
C |
|
-IN A |
2 |
Floating input, circuit will likely not function as expected. Output may be high or low. |
C |
|
+IN A |
3 |
Floating input, circuit will likely not function as expected. Output may be high or low. |
C |
|
V- |
4 |
Lowest voltage pin will driv V- pin internally via internal diode. |
B |
|
+IN B |
5 |
Floating input, circuit will likely not function as expected. Output may be high or low. |
C |
|
-IN B |
6 |
Floating input, circuit will likely not function as expected. Output may be high or low. |
C |
|
OUT B |
7 |
Output cannot be used by application. |
C |
|
V+ |
8 |
Highest voltage pin will drive V+ pin internally via internal diode. |
B |
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|---|
|
OUT A |
1 |
-IN A |
Op amp configured as unity gain buffer. |
C |
|
-IN A |
2 |
+IN A |
No damage to device. Application circuit will not work. |
C |
|
+IN A |
3 |
V- |
Input at V- (GND) is valid input, however, desired application result is unlikely. Output low if -IN A is greater than zero volts. |
C |
|
V- |
4 |
+IN B |
Input at V- (GND) is valid input, however, desired application result is unlikely. Output low if -IN B is greater than zero volts Pins are not adjacent to each other. |
C |
|
+IN B |
5 |
-IN B |
No damage to device. Application circuit will not work. |
C |
|
-IN B |
6 |
OUT B |
Op amp configured as unity gain buffer. |
C |
|
OUT B |
7 |
V+ |
May cause device to overheat. |
B |
|
V+ |
8 |
OUT A |
May cause device to overheat. Pins are not adjacent to each other. |
B |
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
|
OUT A |
1 |
May cause device to overheat. |
B |
|
-IN A |
2 |
Input at V+ is a valid input, however, desired application result is unlikely. Output goes low if +IN A is less than supply. |
C |
|
+IN A |
3 |
Input at V+ is a valid input, however, desired application result is unlikely. Output goes high if -IN A is less than supply. |
C |
|
V- |
4 |
Main supply shorted to V- (GND). No power to device. |
B |
|
+IN B |
5 |
Input at V+ is a valid input, however, desired application result is unlikely. Output goes high if -IN B is less than supply. |
C |
|
-IN B |
6 |
Input at V+ is a valid input, however, desired application result is unlikely. Output goes low if +IN B is less than supply. |
C |
|
OUT B |
7 |
May cause device to overheat. |
B |
|
V+ |
8 |
Normal operation. |
D |