SBOA428 January 2021 INA253-Q1
The failure mode distribution estimation for INA253-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| OUT open (Hi-Z) | 10% |
| OUT saturated to VS or GND | 40% |
| OUT functional, not in specification | 40% |
| Shunt resistor open pin (IN+, IN-, SH+, SH-) | 5% |
| Pin to pin short, any two pins | 5% |