4 Pin Failure Mode Analysis (Pin FMA)

This section provides a Failure Mode Analysis (FMA) for the pins of the TLV9002-Q1 (SOIC (8) and VSSOP (8) packages) and TLV9004-Q1 (SOIC (14) and SOT-23 (14) package). The failure modes covered in this document include the typical pin-by-pin failure scenarios:

• Pin short-circuited to (V-) (see Table 4-2 and Table 4-6)
• Pin open-circuited (see Table 4-3 and Table 4-7)
• Pin short-circuited to an adjacent pin (see Table 4-4 and Table 4-9)
• Pin short-circuited to (V+) (see Table 4-5 and Table 4-8)

Table 4-2 through Table 4-9 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.