SBOA564A December   2022  – August 2024 TRF0206-SP

 

  1.   1
  2.   Single-Event Effects Test Report of the TRF0206-SP 6.5-GHz Differential Amplifier
  3.   Trademarks
  4. Overview
  5. Single-Event Effects
  6. Test Device and Evaluation Board Information
  7. Irradiation Facility and Setup
  8. Depth, Range, and LETEFF Calculation
  9. Test Set-Up and Procedures
  10. Single-Event Latch-up (SEL) Results
  11. Single-Event Transients (SET) Results
  12. Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B Confidence Interval Calculations
  16.   C Orbital Environment Estimations
  17.   D References
  18.   E Revision History

Summary

The purpose of this study was to characterize the effect of heavy-ion irradiation on the single-event effect (SEE) performance of the TRF0206-SP 6.5-GHz, Low Noise, Low Power, Fully-Differential Amplifier. Extensive SEE testing with heavy-ions having LETEFF from 9.75 to 82.1 MeV-cm2/mg were conducted with heavy-ion fluences ranging from 106 to 107 ions/cm2 per run. The SEE results demonstrated that the TRF0206-SP is SEL-free up to LETEFF = 82.1 MeV-cm2/mg. Also the SET cross sections are discussed under static input conditions. CREME96-based worst-week event-rate calculations for LEO(ISS) and GEO orbits clearly demonstrate the robustness of the TRF0206-SP in two harshly conservative space environments.