SBOA564A December 2022 – August 2024 TRF0206-SP
- 1
- Single-Event Effects Test Report of the TRF0206-SP 6.5-GHz Differential Amplifier
- Trademarks
- 1 Overview
- 2 Single-Event Effects
- 3 Test Device and Evaluation Board Information
- 4 Irradiation Facility and Setup
- 5 Depth, Range, and LETEFF Calculation
- 6 Test Set-Up and Procedures
- 7 Single-Event Latch-up (SEL) Results
- 8 Single-Event Transients (SET) Results
- 9 Event Rate Calculations
- 10Summary
- A Total Ionizing Dose from SEE Experiments
- B Confidence Interval Calculations
- C Orbital Environment Estimations
- D References
- E Revision History
8 Single-Event Transients (SET) Results
The TRF0206-SP was characterized for SETs from 9.75to 74.92 MeV-cm2/mg (Table 5-1 provides more information) at 3.2 V supply voltage. The device was tested at room temperature for all SETs runs. TRF0206-SP devices were thinned for proper heavy-ion penetration into the active circuits. Average flux of 105 ions/cm2-s and fluences of 107 ions/cm2 per run were used during the heavy ion characterization. The devices were tested under static (DC) inputs. The SETs discussed on this report were defined as output voltages excursion that exceed a window trigger set on the DPO7104C. Outputs of the TRF0206-SP were monitored under both conditions each leg of the differential outputs was terminated at 50 Ω in the EVM. Test conditions used during the testing are provided in Table 8-1. Positive and negative upsets excursions were observed under DC test. For each upset the maximum, minimum and transient recovery time was recorded. Weibull-Fit and cross section for the DC tests are shown in Figure 8-1 and Figure 8-2 respectively. The Weibull equation used for the fit is shown in Equation 1, and parameters are provided in Table 8-2. To calculate the cross section values at the different supply voltages the total number of upsets (or transients) and the fluences where combined (add together) by LETEFF to calculate the upper bound cross section (as discussed in Appendix B) at 95% confidence interval. The σPERCASE cross section presented on the summary tables, was calculated using the MTBF method at 95% confidence. When observing the upsets, both outputs legs (inverting and non-inverting) track each other for most of the time. Since both legs track each other differentially the upset is cancelled.
| Run # | Unit # | Test Type | Temp (oC) | Ion Type | LETEFF (MeV·cm2/mg) | Flux (ions/cm2·s) | Fluence (ions/cm2) | Uniformity6 | Trigger Value | # Events (OUTP) | # Events (OUTM) |
|---|---|---|---|---|---|---|---|---|---|---|---|
| 1 | 3 | SET | 25 | Ar | 9.75 | 1.07E+05 | 1.00E+07 | 91 % | LL = –60 mV; UL = 60 mV | 52 | 56 |
2 | 3 | SET | 25 | Cu | 24.54 | 1.22E+05 | 1.00E+07 | 90 % | LL = –60 mV; UL = 60 mV | 59 | 58 |
| 3 | 3 | SET | 25 | Cu | 24.54 | 1.17E+05 | 1.00E+07 | 88 % | LL = –30 mV; UL = 30 mV | 88 | 97 |
| 4 | 3 | SET | 25 | Cu | 24.54 | 1.24E+05 | 1.00E+07 | 90 % | LL = –10 mV; UL = 10 mV | 99 | 94 |
| 5 | 3 | SET | 25 | Kr | 36.1 | 1.23E+05 | 1.00E+07 | 93 % | LL = –10 mV; UL = 10 mV | 84 | 96 |
| 6 | 3 | SET | 25 | Ag | 57.74 | 1.15E+05 | 1.00E+07 | 83 % | LL = –10 mV; UL = 10 mV | 96 | 96 |
| 7 | 3 | SET | 25 | Ag | 67.95 | 9.08E+04 | 1.00E+07 | 83 % | LL = –10 mV; UL = 10 mV | 234 | 234 |
| 8 | 3 | SET | 25 | Pr | 70.6 | 1.08E+05 | 1.00E+07 | 97 % | LL = –10 mV; UL = 10 mV | 115 | 112 |
| 9 | 3 | SET | 25 | Pr | 74.92 | 1.18E+05 | 1.00E+07 | 97 % | LL = –10 mV; UL = 10 mV | 143 | 143 |
| 10 | 3 | SET | 25 | Ar | 9.75 | 1.38E+05 | 1.00E+07 | 88 % | LL = –60 mV; UL = 60 mV | 47 | 48 |
11 | 3 | SET | 25 | Ar | 9.75 | 1.24E+05 | 1.00E+07 | 89 % | LL = –100 mV; UL = 100 mV | 18 | 18 |
12 | 3 | SET | 25 | Ar | 9.75 | 1.79E+05 | 1.00E+07 | 92 % | LL = –120 mV; UL = 120 mV | 6 | 6 |
Figure 8-1 Cross Section and Weibull-Fit for the DC Test on OUTP
Figure 8-2 Cross Section and Weibull-Fit for the DC Test on OUTM| Parameter | OUTP | OUTM |
|---|---|---|
| Onset (MeV-cm2/mg) | 1.00 | 1.00 |
| σSAT (cm2) | 0.00004 | 0.00004 |
| W | 40 | 40 |
| s | 1 | 1 |