M. Shoga and D. Binder, “Theory of Single Event Latchup in
Complementary Metal-Oxide Semiconductor ICs”, IEEE Trans. Nucl. Sci,, 33(6),
Dec. 1986, pp. 1714-1717.
G. Bruguier and J.M. Palau, “Single particle-induced latchup”,
IEEE Trans. Nucl. Sci, Vol. 43(2), Mar. 1996, pp. 522-532.
“The Stopping and Range of Ions in Matter” (SRIM) software
simulation tools website. http://www.srim.org/index.htm#SRIMMENU
D. Kececioglu, “Reliability and Life Testing Handbook”, Vol. 1,
PTR Prentice Hall, New Jersey,1993, pp. 186-193.
https://creme.isde.vanderbilt.edu/CREME-MC
A. J. Tylka, et al., "CREME96: A Revision of the Cosmic Ray
Effects on Micro-Electronics Code", IEEE Trans. Nucl. Sci., 44(6), 1997, pp.
2150-2160.
A. J. Tylka, W. F. Dietrich, and P. R. Bobery, “Probability
distributions of high-energy solar-heavy-ion fluxes from IMP-8: 1973-1996”, IEEE
Trans. on Nucl. Sci., 44(6), Dec. 1997, pp. 2140 – 2149.
A. J. Tylka, J. H. Adams, P. R. Boberg, et al.,“CREME96: A
Revision of the Cosmic Ray Effects on Micro-Electronics Code”, Trans. on Nucl.
Sci, 44(6), Dec. 1997, pp. 2150 – 2160.