Electrical Overstress (EOS) events are over-voltage events that expose a device to voltages beyond survivable rating (or Absolute Maximum Voltage Rating). Once the event persists longer than a few hundred Nano-seconds, this can be considered EOS. The EOS events mostly occur when IC components are assembled on the PCB. EOS events can usually turn on ESD cells and cause them to conduct currents for longer than designed for, thus generating damaging heat.

In general, CSA damage risk from EOS events can be prevented with input resistors that limit input currents to < 5mA peak and or voltage clamps that clamp input pins to under the Absolute Maximum Ratings shown in data sheet.