Abstract

The purpose of this study was to characterize the effects of heavy-ion irradiation on the single-event latchup (SEL) performance of the INA901-SP, 65V, low-high-side, high-speed, voltage output current sense amplifier. Heavy ions with an LET_EFF of 76 to 93MeV-cm²/ mg were used to irradiate one device with a fluence of 1 × 10⁷ ions / cm². The results demonstrate that the INA901-SP is SEL-free up to LET_EFF = 93MeV-cm² / mg at 125°C.