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SBOK061 October 2022 SN54SLC8T245-SEP

5.2 Single Event Transient (SET) Results

SETs are defined as heavy-ion-induced transients upsets on VOUT of the TPS7H1210-SEP. SET testing was performed at around 25°C. The species used for the SET testing was a Silver (¹⁰⁹Ag) ion with an angle-of incidence of 0° for an LETEFF = 43 MeV·cm² /mg. Flux of approximately 9.6× 10³ to 1.1 × 10⁴ ions/cm² ·s and a fluence of approximately 1 × 10⁶ ions/cm² were used for the twelve SET runs.

Figure 3-2 shows the three main scenarios that were tested. The device was configured with clock signals ranging from 100 kHz to 5 MHz as inputs for channels A2 and A7.

Table 5-2 Summary of SN54SLC8T245-SEP SET Test Condition and Results

RUN #	LET_EFF (MeV·cm²/mg)	DISTANCE (mm)	FLUX (ions·cm²/mg)	FLUENCE (# ions)	UNIFORM	V_CCA (V)	V_CCB (V)	INPUT FREQ.	PULSE WIDTH	SAMPLING RATE
1	43	40	9.7 × 10³	1 × 10⁶	99%	1 V	1 V	1 MHz	2 µs/div	200 MS/s
2	43	40	9.6 × 10³	1 × 10⁶	99%	1 V	1 V	1 MHz	10 µs/div	200 MS/s
3	43	40	1.1 × 10⁴	1 × 10⁶	99%	1 V	1 V	1 MHz	10 µs/div	200 MS/s
5	43	40	1.17 × 10⁴	1 × 10⁶	99%	3.3 V	3.3 V	5 MHz	1 µs/div	1 GS/s
6	43	40	1 × 10⁴	1 × 10⁶	98%	3.3 V	3.3 V	5 MHz	1 µs/div	1 GS/s
7	43	40	1 × 10⁴	1 × 10⁶	98%	1 V	1 V	5 MHz	1 µs/div	1 GS/s
8	43	40	1.09 × 10⁴	1 × 10⁶	98%	1.8 V	1.8 V	5 MHz	1 µs/div	1 GS/s
9	43	40	1.1 × 10⁴	1 × 10⁶	98%	3.3 V	1 V	5 MHz	1 µs/div	1 GS/s
10	43	40	1.1 × 10⁴	1 × 10⁶	98%	2.5 V	1 V	5 MHz	1 µs/div	1 GS/s
11	43	40	1.1 × 10⁴	1 × 10⁶	98%	1 V	3.3 V	5 MHz	1 µs/div	1 GS/s
12	43	40	1.08 × 10⁴	1 × 10⁶	97%	3 V	1 V	5 MHz	1 µs/div	1 GS/s
13	43	40	1.1 × 10⁴	1 × 10⁶	97%	3.3 V	3.3 V	100 kHz	50 µs/div	20 MS/s

Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report, the upper-bound cross section (using a 95% confidence level) is calculated as:

Equation 2.

\frac{σ S E T \leq 3.6 9 \times 10^{- 6} {c m}^{2}}{d e v i c e} f o r L E T E F F = \frac{43 M e V \times {c m}^{2}}{m g} a n d T = 25 ° C