This report covers the radiation characterization
results of the SN54SC245-SEP ctal bus transceivers. The study was done to determine
Total Ionizing Dose (TID) effects under high dose rate (HDR) up to 50 krad(Si) as a
one time characterization. The results show that all samples passed within the
specified limits up to 50 krad(Si). However, Radiation Lot Acceptance Testing (RLAT)
will be performed using 22 units at a dose level of 30 krad(Si) for future wafer
lots. Furthermore, the SN54SC245-SEP is packaged in a space enhanced plastic for low
outgassing characteristics and is Single Event Latch-Up (SEL) immune up to 43
MeV-cm2/mg, which makes the device an option for low Earth orbit
space applications. The device can be used to drive signals over relatively long
traces or transmission lines.