SBOU157 September 2015 OPT8241
All of these chipsets measure depth based on ToF principle where the scene is illuminated with modulated light at 850-nm wavelength. The phase difference between the emitted light and the light reflecting off the scene is measured, per pixel, and converted to depth; then the depth image is converted to point clouds, where each pixel is transformed into 3D coordinates with the origin at the optical center of the 3D ToF imager.