SBVA076A December 2019 – September 2021 TPS3850-Q1
The failure mode distribution estimation for TPS3850-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| RESET (or WDO) fails to trip | 10% |
| RESET (or WDO) false trip | 10% |
| RESET trip outside specification (voltage or time) | 30% |
| WDO trip outside specification (voltage or time) | 50% |