SCDA023B April 2020 – January 2022 TMUX1308-Q1 , TMUX1309-Q1
The figure below shows the TMUX1309-Q1 pin diagram for the WQFN package. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TMUX1308-Q1 and TMUX1309-Q1 data sheet.
Pin Name |
Pin No. |
Description of Potential Failure Effect(s) |
Failure Effect Class |
---|---|---|---|
S0B |
1 |
Corruption of signal passed onto the DB pin. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
S2B |
2 |
Corruption of signal passed onto the DB pin. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
DB |
3 |
Corruption of signal passed onto the SxB pins. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
S3B |
4 |
Corruption of signal passed onto the DB pin. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
S1B |
5 |
Corruption of signal passed onto the DB pin. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
EN |
6 |
EN stuck low. Can no longer disable the device without power down. |
B |
N.C. |
7 |
No effect, unconnected pin. |
D |
GND |
8 |
No effect, normal operation. |
D |
A1 |
9 |
Address stuck low. Cannot control switch states. |
B |
A0 |
10 |
Address stuck low. Cannot control switch states. |
B |
S3A |
11 |
Corruption of signal passed onto the DA pin. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
S0A |
12 |
Corruption of signal passed onto the DA pin. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
DA |
13 |
Corruption of signal passed onto the SxA pins. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
S1A |
14 |
Corruption of signal passed onto the DA pin. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
S2A |
15 |
Corruption of signal passed onto the DA pin. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
VDD |
16 |
Device is unpowered. Device is not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. |
A |
Thermal pad |
— |
No effect, normal operation. |
D |
Pin Name |
Pin No. |
Description of potential failure effect(s) |
Failure effect class |
---|---|---|---|
S0B |
1 |
Corruption of signal passed onto the DB pin. |
B |
S2B |
2 |
Corruption of signal passed onto the DB pin. |
B |
DB |
3 |
Corruption of signal passed onto the SxB pins. |
B |
S3B |
4 |
Corruption of signal passed onto the DB pin. |
B |
S1B |
5 |
Corruption of signal passed onto the DB pin. |
B |
EN |
6 |
Loss of control of EN pin. Cannot disable switch. Will default to switches disabled. |
B |
N.C. |
7 |
No effect, unconnected pin. |
D |
GND |
8 |
Device is unpowered. Device is not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. |
A |
A1 |
9 |
Loss of control of address pin. Cannot control switch. |
B |
A0 |
10 |
Loss of control of address pin. Cannot control switch. |
B |
S3A |
11 |
Corruption of signal passed onto the DA pin. |
B |
S0A |
12 |
Corruption of signal passed onto the DA pin. |
B |
DA |
13 |
Corruption of signal passed onto the SxA pin. |
B |
S1A |
14 |
Corruption of signal passed onto the DA pin. |
B |
S2A |
15 |
Corruption of signal passed onto the DA pin. |
B |
VDD |
16 |
Device is unpowered. Device is not functional. |
B |
Thermal pad |
— |
No effect, normal operation. |
D |
Pin Name |
Pin No. |
Shorted to |
Description of potential failure effect(s) |
Failure effect class |
---|---|---|---|---|
S0B |
1 |
S2B |
Possible corruption of signal passed onto the DB pin. |
B |
S2B |
2 |
DB |
Possible corruption of signal passed onto the SxB and DB pin. |
B |
DB |
3 |
S3B |
Possible corruption of signal passed onto the SxB and DB pin. |
B |
S3B |
4 |
S1B |
Possible corruption of signal passed onto the DB pin. |
B |
S1B |
5 |
EN |
Possible corruption of signal passed onto the DB pin. Switch state will be undefined. |
B |
EN |
6 |
N.C. |
No connect pin electrically floating, no effect. |
D |
N.C. |
7 |
GND |
No connect pin electrically floating, no effect. |
D |
GND |
8 |
A1 |
Not considered, corner pin. |
D |
A1 |
9 |
A0 |
Control of switch state is lost. |
B |
A0 |
10 |
S3A |
Possible corruption of signal passed onto the DA pin. Control of switch state is lost. |
B |
S3A |
11 |
S0A |
Possible corruption of signal passed onto the DA pin. |
B |
S0A |
12 |
DA |
Possible corruption of signal passed onto the SxA and DA pin. |
B |
DA |
13 |
S1A |
Possible corruption of signal passed onto the SxA and DA pin. |
B |
S1A |
14 |
S2A |
Possible corruption of signal passed onto the DA pin. |
B |
S2A |
15 |
VDD |
Corruption of signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
VDD |
16 |
S0B |
Not considered, corner pin. |
D |
Pin Name |
Pin No. |
Description of potential failure effect(s) |
Failure effect class |
---|---|---|---|
S0B |
1 |
Corruption of signal passed onto the DB pin. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
S2B |
2 |
Corruption of signal passed onto the DB pin. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
DB |
3 |
Corruption of signal passed onto the SxB pins. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
S3B |
4 |
Corruption of signal passed onto the DB pin. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
S1B |
5 |
Corruption of signal passed onto the DB pin. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
EN |
6 |
EN stuck high. Can no longer enable the device. |
B |
N.C. |
7 |
No effect, unconnected pin. |
D |
GND |
8 |
Device is unpowered. Device is not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be plausible. |
A |
A1 |
9 |
Address stuck high. Cannot control switch states. |
B |
A0 |
10 |
Address stuck high. Cannot control switch states. |
B |
S3A |
11 |
Corruption of signal passed onto the DA pin. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
S0A |
12 |
Corruption of signal passed onto the DA pin. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
DA |
13 |
Corruption of signal passed onto the SxA pins. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
S1A |
14 |
Corruption of signal passed onto the DA pin. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
S2A |
15 |
Corruption of signal passed onto the DA pin. If there is no limiting resistor in the switch path, then device damage is possible. |
A |
VDD |
16 |
No effect, normal operation. |
D |
Thermal pad |
— |
No connect pin electrically floating, no effect. |
D |