SCLK032 November 2023 SN74LV2T74-EP
PRODUCTION DATA
TI Device: SN74LV2T74-EP
DLA VID: V62/24609-01XE
TI qualification testing is a risk mitigation process that is engineered to assure device longevity in customer applications. Wafer fabrication processes and package level reliability are evaluated in a variety of ways that may include accelerated environmental test conditions with subsequent derating to actual use conditions. Manufacturability of the device is evaluated to verify a robust assembly flow and assure continuity of supply to customers. TI Enhanced Products are qualified with industry standard test methodologies performed to the intent of Joint Electron Devices Engineering Council (JEDEC) standards and procedures. Texas Instruments Enhanced Products are certified to meet GEIA-STD-0002-1 Aerospace Qualified Electronic Components.