This report covers the radiation characterization results of the SN54SC2T74-SEP radiation tolerant, dual D-type flip-flop with integrated translation. The study was done to determine Total Ionizing Dose (TID) effects under high dose rate (HDR) up to 50 krad(Si) as a one time characterization. The results show that all samples passed within the specified limits up to 50 krad(Si). Radiation Lot Acceptance Testing (RLAT) will be performed using 5 units at a dose level of 30 krad(Si) for future wafer lots per MIL-STD-883 TM 1019.
The SN54SC2T74-SEP is packaged in a space enhanced plastic package for low outgassing characteristics and is Single Event Latch-Up (SEL) immune up to 43 MeV-cm2/mg, which makes the device an option for low Earth orbit space applications. Single Event Transient (SET) data is also provided in the Single Event Effects Radiation Report.