This report covers the Radiation Lot Acceptance Testing (RLAT)
results of the SN54SC3T98-SEP radiation tolerant, configurable multiple-function
gate. The study was done to determine Total Ionizing Dose (TID) effects under high
dose rate (HDR) to 30 krad(Si). Radiation Lot Acceptance Testing (RLAT) was
performed using 5 units at a dose level of 30 krad(Si) per MIL-STD-883 TM 1019, and
all future wafer lots will be tested to the same conditions.
The SN54SC3T98-SEP is packaged in
a space enhanced plastic for low outgassing characteristics and is Single Event
Latch-Up (SEL) immune up to 43 MeV-cm2/mg, which makes the device an
option for low Earth orbit space applications.
For full total ionizing
dose characterization results, see SN54SC4T125-SEP Total Ionizing
Dose (TID) Report.