Abstract

This report discusses the radiation characterization results of the SN54SC6T07-SEP radiation tolerant, hex open-drain buffer with integrated translation. The study was done to determine Total Ionizing Dose (TID) effects under high dose rate (HDR) up to 50krad(Si) as a one time characterization. The results show that all samples passed within the specified limits up to 50krad(Si). Radiation Lot Acceptance Testing (RLAT) will be performed using five units at a dose level of 30 krad(Si) for future wafer lots per MIL-STD-883 TM 1019.

The SN54SC6T07-SEP is packaged in a space enhanced plastic for low outgassing characteristics and is Single Event Latch-Up (SEL) immune up to 43MeV-cm² / mg, which makes the device an option for low Earth orbit space applications.

The SN54SC6T07-SEP Total Ionizing Dose (TID) Report covers the TID performance of all four devices listed below. The SN54SC6T07-SEP device covers all functional blocks and active die area of the other three devices, which is why the device was selected for total ionizing dose testing for this group of voltage translation devices.

• SN54SC6T07-SEP
• SN54SC6T06-SEP
• SN54SC6T14-SEP
• SN54SC6T17-SEP