Abstract

This report discusses the radiation characterization results of the SN54SC6T17-SEP hex schmitt-trigger buffer with integrated translation. The study was done to determine Total Ionizing Dose (TID) effects under high dose rate (HDR) to 30krad(Si). Radiation Lot Acceptance Testing (RLAT) was performed using five units at a dose level of 30krad(Si) per MIL-STD-883 TM 1019. All future wafer lots will be tested under the same conditions.

The SN54SC6T17-SEP is packaged in a space enhanced plastic for low outgassing characteristics and is Single Event Latch-Up (SEL) immune up to 43MeV-cm² / mg, which makes the device an option for low Earth orbit space applications.

For full total ionizing dose characterization results, see SN54SC6T07-SEP Total Ionizing Dose (TID) Report.