SCLK052 February   2024 SN54SC6T06-SEP , SN54SC6T07-SEP , SN54SC6T14-SEP , SN54SC6T17-SEP

 

  1.   1
  2.   SN54SC6T07-SEP Single-Event Latch-Up (SEL) Radiation Report
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 SEL Results
    2. 5.2 Event Rate Calculations
  9. 6Summary
  10. 7References

Test Device and Test Board Information

The SN54SC6T07-SEP is a packaged 14-pin, TSSOP plastic package shown in Figure 3-1 . Figure 3-2 shows the device with the package cap decapped to reveal the die for heavy ion testing. Figure 3-3 shows the evaluation board used for radiation testing. Figure 3-4 shows the bias diagram used for Single-Event Latch-up (SEL) testing.

GUID-20240126-SS0I-GQ2H-R2RR-HHHKR3NF3XXK-low.jpgFigure 3-1 SN54SC6T07-SEP Pinout Diagram
GUID-20240126-SS0I-BS98-MNS9-KDGSXH2DCNN8-low.jpgFigure 3-2 Photo of SN54SC6T07-SEP Package Decapped
GUID-20240126-SS0I-GSSX-ZN39-GJ5M4PFTKKVT-low.jpgFigure 3-3 SN54SC6T07-SEP Evaluation Board (Top View)
GUID-20240202-SS0I-CCGZ-VPB9-HN20K0ZWDWGR-low.svgFigure 3-4 SN54SC6T07-SEP SEL Bias Diagram
GUID-20240126-SS0I-11HQ-X0ZG-DMW1M2XWT2P6-low.jpgFigure 3-5 SN54SC6T07-SEP Thermal Image for SEL