The C2000 MCU device family products are primarily synchronous logic devices and as such require clock signals for proper operation. The clock management logic includes clock sources, clock generation logic including clock multiplication by phase lock loops (PLLs), clock dividers, and clock distribution logic. The registers that are used to program the clock management logic are located in the system control module. The following tests can be applied as diagnostics for this module (to provide diagnostic coverage on a specific function):

• Missing Clock Detect (MCD)
• Clock Integrity Check Using CPU Timer
• Clock Integrity Check Using HRPWM
• Internal Watchdog (WD)
• External Watchdog
• Periodic Software Read Back of Static Configuration Registers
• Software Read Back of Written Configuration
• PLL Lock Profiling Using On-Chip Timer
• Peripheral Clock Gating (PCLKCR)
• Dual Clock Comparator (DCC) - Type 1

The following tests can be applied as test-for-diagnostics on this module to meet Latent Fault Metric Requirements:

• Software Test of Watchdog (WD) Operation
• Software Test of Missing Clock Detect Functionality