The SRAM modules implemented in the TMS320F2838xD/S MCU device family have a bit multiplexing scheme implemented such that the bits accessed to generate a logical (CPU) word are not physically adjacent. This scheme helps to reduce the probability of physical multibit faults resulting in logical multibit faults rather they manifest as multiple single bit faults. The SECDED SRAM ECC diagnostic can correct a single bit fault and detect double bit fault in a logical word. Similarly, the SRAM parity diagnostic can detect single bit faults. This scheme improves the usefulness of the SRAM ECC and parity diagnostic. Bit multiplexing is a feature of the SRAM and cannot be modified by the software.