SFFS055 March 2021 SN65HVD1780 , SN65HVD1781 , SN65HVD1782

2 Functional Safety Failure In Time (FIT) Rates

This section provides Functional Safety Failure In Time (FIT) rates for SN65HVD1780, SN65HVD1781, and SN65HVD1782 based on two different industry-wide used reliability standards:

Table 2-1 provides FIT rates based on IEC TR 62380 / ISO 26262 part 11
Table 2-4 provides FIT rates based on the Siemens Norm SN 29500-2

Table 2-1 Component Failure Rates per IEC TR 62380 / ISO 26262 Part 11 for SN65HVD1780

FIT IEC TR 62380 / ISO 26262	FIT (Failures Per 10⁹ Hours) 8-pin SOIC (D) JEDEC high-K model	FIT (Failures Per 10⁹ Hours) 8-pin PDIP (P) JEDEC high-K model	FIT (Failures Per 10⁹ Hours) 8-pin SOIC (D) JEDEC low-K model	FIT (Failures Per 10⁹ Hours) 8-pin PDIP (P) JEDEC low-K model
Total Component FIT Rate	19	27	13	23
Die FIT Rate	10	5	5	3
Package FIT Rate	9	22	9	20

Table 2-2 Component Failure Rates per IEC TR 62380 / ISO 26262 Part 11 for SN65HVD1781

FIT IEC TR 62380 / ISO 26262	FIT (Failures Per 10⁹ Hours) 8-pin SOIC (D) JEDEC high-K model	FIT (Failures Per 10⁹ Hours) 8-pin PDIP (P) JEDEC high-K model	FIT (Failures Per 10⁹ Hours) 8-pin SOIC (D) JEDEC low-K model	FIT (Failures Per 10⁹ Hours) 8-pin PDIP (P) JEDEC low-K model
Total Component FIT Rate	20	27	14	23
Die FIT Rate	11	5	6	3
Package FIT Rate	9	22	8	20

Table 2-3 Component Failure Rates per IEC TR 62380 / ISO 26262 Part 11 for SN65HVD1782

FIT IEC TR 62380 / ISO 26262	FIT (Failures Per 10⁹ Hours) 8-pin SOIC (D) JEDEC high-K model	FIT (Failures Per 10⁹ Hours) 8-pin PDIP (P) JEDEC high-K model	FIT (Failures Per 10⁹ Hours) 8-pin SOIC (D) JEDEC low-K model	FIT (Failures Per 10⁹ Hours) 8-pin PDIP (P) JEDEC low-K model
Total Component FIT Rate	26	30	16	25
Die FIT Rate	16	7	7	4
Package FIT Rate	10	23	9	21

The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:

Mission Profile: Motor Control from Table 11
Power dissipation: 290 mW
Climate type: World-wide Table 8
Package factor (lambda 3): Table 17b
Substrate Material: FR4
EOS FIT rate assumed: 0 FIT

Table 2-4 Component Failure Rates per Siemens Norm SN 29500-2

Table	Category	Reference FIT Rate	Reference Virtual T_J
5	CMOS, BICMO Digital analog / mixed	25 FIT	55°C

The Reference FIT Rate and Reference Virtual T_J (junction temperature) in Table 2-4 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.