SFFS058A March 2021 – December 2021 DRV8245-Q1

3 Failure Mode Distribution (FMD)

The failure mode distribution estimation for DRV8245-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.

The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.

Table 3-1 Die Failure Modes and Distribution

Die Failure Modes	Failure Mode Distribution (%)
Output is stuck LOW when commanded OFF (GND short)	14%⁽²⁾
Output is stuck HIGH when commanded OFF (VM short)	14%⁽²⁾
Output is stuck OFF when commanded LOW (Open)	8%⁽²⁾
Output is stuck OFF when commanded HIGH (Open)	8%⁽²⁾
Output ON resistance too high when commanded LOW	12%⁽²⁾
Output ON resistance too high when commanded HIGH	18%⁽²⁾
Low side slew rate too fast or too slow (high-side recirculation)	5%⁽²⁾
High side slew rate too fast or too slow (low-side recirculation)	5%⁽²⁾
Dead-time is too short	1%⁽²⁾
Current sense feedback incorrect	3%
ITRIP current regulation incorrect	3%
Incorrect communication (SPI variant)/ configuration interpretation (HW variant)	4%⁽¹⁾
Incorrect input interpretation (nSLEEP, DRVOFF, EN/IN1, PH/IN2)	4%⁽¹⁾
Incorrect nFAULT assertion	1%

(1) 1% for each pin function

(2) 50% for OUT1, 50% for OUT2