SFFS059 January 2023 DRV8145-Q1
4.3 HW variant in VQFN-HR package
Figure 4-4shows the pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the DRV8145-Q1 data sheet.
Figure 4-4 HW variantTable 4-10 Pin FMA for Device Pins
Short-Circuited to Ground
| Pin | Description of Potential Failure Effect(s) | Failure Effect Class | |
|---|---|---|---|
| No. | Name | ||
| 1 | nFAULT | False fault signalling. Devie will continue to operate as commanded. | B |
| 2 | IPROPI | IPROPI feedback is lost. ITRIP regulation, if enabled, is also lost. | B |
| 3 | nSLEEP | Device will be in SLEEP state and outputs are Hi-Z | B |
| 4 | VM | Device is powered off with driver Hi-Z. | B |
| 5, 6 | OUT | If OUT is commanded to be pulled high, short is detected and OUT is Hi-Z. | B |
| 7 | GND | Normal function. | D |
| 8, 9 | OUT | If OUT is commanded to be pulled high, short is detected and OUT is Hi-Z. | B |
| 10 | VCP | Device damage possible. Device behavior can not be guaranteed. | A |
| 11 | DRVOFF | Shutoff function is lost. | B |
| 12 | IN | External PWM control is lost. Internal ITRIP regulation is ok. No risk of spin direction reversal. | B |
| 13 | DIAG | Wrong load and fault response configuration possible. | B |
| 14 | SR | Wrong SR configuration possible, EM performance may be affected. | B |
| 15 | ITRIP | Incorrect ITRIP level for current regulation possible. | B |
| 16 | NC | Unused pin. | D |
Table 4-11 Pin FMA for Device Pins
Open-Circuited
| Pin | Description of Potential Failure Effect(s) | Failure Effect Class | |
|---|---|---|---|
| No. | Name | ||
| 1 | nFAULT | False fault signalling. Devie will continue to operate as commanded. | B |
| 2 | IPROPI | IPROPI feedback is lost. Load will be forced to recirculte if ITRIP regulation is enabled. | B |
| 3 | nSLEEP | Device will be in SLEEP state and outputs are Hi-Z | B |
| 4 | VM | Device is powered off with driver Hi-Z. | B |
| 5, 6 | OUT | Load drive capability is lost. | B |
| 7 | GND | Normal function. | D |
| 8, 9 | OUT | Load drive capability is lost. | B |
| 10 | VCP | The driver can't keep up with PWM frequency > 20 KHz. | B |
| 11 | DRVOFF | Pin based shutoff is triggered and OUT is Hi-Z. | B |
| 12 | IN | External PWM control is lost. Internal ITRIP regulation is ok. No risk of spin direction reversal. | B |
| 13 | DIAG | Wrong load and fault response configuration possible. | B |
| 14 | SR | Wrong SR configuration possible, EM performance may be affected. | B |
| 15 | ITRIP | Incorrect ITRIP level for current regulation possible. | B |
| 16 | NC | Not used. | D |
Table 4-12 Pin FMA for Device Pins
Short-Circuited to Adjacent Pin
| Short between pins | Description of Potential Failure Effect(s) | Failure Effect Class | |
|---|---|---|---|
| nFAULT | NC | Fault signaling function is unaffected. | D |
| IPROPI | nFAULT | False fault signaling possible. IPROPI feedback is inaccurate. ITRIP regulation levels, if enabled, will be lower. | B |
| nSLEEP | IPROPI | IPROPI feedback is inaccurate. ITRIP regulation levels, if enabled, will be lower. | B |
| VM | nSLEEP | SLEEP functionality is lost. | B |
| OUT | VM | If OUT is commanded to be pulled low, short is detected and OUT is Hi-Z. | B |
| GND | OUT | If OUT is commanded to be pulled high, short is detected and OUT is Hi-Z. | B |
| VCP | VM | Pull up path RON (High-side FET) will be much higher. | B |
| DRVOFF | VCP | Device damage possible. Device behavior can not be guaranteed. | A |
| IN | DRVOFF | Either OUT is Hi-Z or external PWM control is lost. Internal ITRIP regulation is ok. No risk of spin direction reversal. | B |
| DIAG | IN | Wrong load and fault response configuration possible. Internal ITRIP regulation is OK. No risk of spin direction reversal. | B |
| SR | DIAG | Wrong configuration - EM performance may be affected. Load and fault response may be incorrect. | B |
| ITRIP | SR | Wrong configuration - EM performance may be affected. Incorrect ITRIP level for current regulation possible. | B |
| NC | ITRIP | ITRIP setting is unaffected. | D |
Table 4-13 Pin FMA for Device Pins
Short-Circuited to
VM
| Pin | Description of Potential Failure Effect(s) | Failure Effect Class | |
|---|---|---|---|
| No. | Name | ||
| 1 | nFAULT | Device damage possible. | A |
| 2 | IPROPI | Device damage possible. | A |
| 3 | nSLEEP | SLEEP functionality is lost. | B |
| 4 | VM | Normal function. | D |
| 5, 6 | OUT | If OUT is commanded to be pulled low, short is detected and OUT is Hi-Z. | B |
| 7 | GND | Normal function. | D |
| 8, 9 | OUT | If OUT is commanded to be pulled low, short is detected and OUT is Hi-Z. | B |
| 10 | VCP | Pull up path RON (High-side FET) will be much higher. | B |
| 11 | DRVOFF | OUT is Hi-Z. | B |
| 12 | IN | Device damage possible. | A |
| 13 | DIAG | Device damage possible. | A |
| 14 | SR | Device damage possible. | A |
| 15 | ITRIP | Device damage possible. | A |
| 16 | NC | Device damage possible. | A |