SFFS059 January 2023 DRV8145-Q1
Figure 4-2 shows the pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the DRV8145-Q1 data sheet.
| Pin | Description of Potential Failure Effect(s) | Failure Effect Class | |
|---|---|---|---|
| No. | Name | ||
| 1 | SCLK | SPI communication is lost. | B |
| 2 | nSCS | SPI communication is lost. | B |
| 3 | IN | External PWM control is lost. Internal ITRIP regulation is ok. No risk of spin direction reversal. | B |
| 4 | DRVOFF | Pin based shutoff function is lost. | B |
| 5 | VCP | Device damage possible. Device behavior can not be guaranteed. | A |
| 6, 7, 8, 21, 22, 23 | VM | Device is powered off with driver Hi-Z. | B |
| 9, 10, 11, 18, 19, 20 | OUT | If OUT is commanded to be pulled high, short is detected and OUT is Hi-Z. | B |
| 12, 13, 14, 15, 16, 17 | GND | Normal function. | D |
| 24 | nSLEEP | Both "S" & "P" variants: Device will be in SLEEP state and OUT is Hi-Z | B |
| VDD | |||
| 25 | IPROPI | IPROPI feedback is lost. ITRIP regulation, if enabled, is also lost. | B |
| 26 | nFAULT | False fault signaling possible. Device will continue to operate as commanded. | B |
| 27 | SDO | SPI communication is lost. | B |
| 28 | SDI | SPI communication is lost. | B |
| Pin | Description of Potential Failure Effect(s) | Failure Effect Class | |
|---|---|---|---|
| No. | Name | ||
| 1 | SCLK | SPI communication is lost. | B |
| 2 | nSCS | SPI communication is lost. | B |
| 3 | IN | External PWM control is lost. Internal ITRIP regulation is OK. No risk of spin direction reversal. | B |
| 4 | DRVOFF | Pin based shutoff is triggered and OUT is Hi-Z | B |
| 5 | VCP | The driver can't keep up with PWM frequency > 20 KHz | B |
| 6, 7, 8, 21, 22, 23 | VM | Device is powered off with driver Hi-Z. | B |
| 9, 10, 11, 18, 19, 20 | OUT | Load drive capability is lost. | B |
| 12, 13, 14, 15, 16, 17 | GND | Normal function. | D |
| 24 | nSLEEP | Both "S" & "P" variants: Device will be in SLEEP state and OUT is Hi-Z. | B |
| VDD | |||
| 25 | IPROPI | IPROPI feedback is lost. Load will be forced to recirculate if ITRIP regulation is enabled. | B |
| 26 | nFAULT | False fault signaling possible. Device will continue to operate as commanded. | B |
| 27 | SDO | SPI communication is lost. | B |
| 28 | SDI | SPI communication is lost. | B |
| Short between pins | Description of Potential Failure Effect(s) | Failure Effect Class | |
|---|---|---|---|
| SCLK | SDI | SPI communication is lost. | B |
| nSCS | SCLK | SPI communication is lost. | B |
| IN | nSCS | SPI communication is affected. External PWM control is lost. Internal ITRIP regulation is OK. No risk of spin direction reversal. | B |
| DRVOFF | IN | Either OUT is Hi-Z or external PWM control is lost. Internal ITRIP regulation is ok. No risk of spin direction reversal. | B |
| VCP | DRVOFF | Device damage possible. Device behavior can not be guaranteed. | A |
| VM | VCP | Pull up path RON (High-side FET) will be much higher. | B |
| OUT | VM | If OUT is commanded to be pulled low, short is detected and OUT is Hi-Z. | B |
| GND | OUT | If OUT1 is commanded to be pulled high, short is detected and OUT is Hi-Z. | B |
| nSLEEP | VM | "S" variant: SLEEP functionality is lost. | B |
| VDD | "P" variant: Device damage possible. Device behavior can not be guaranteed. | A | |
| IPROPI | nSLEEP | "S" variant: IPROPI feedback is inaccurate. ITRIP regulation levels, if enabled, will be lower. | B |
| VDD | "P" variant: IPROPI feedback is inaccurate. OUT is Hi-Z if ITRIP regulation is enabled. | ||
| nFAULT | IPROPI | False fault signaling possible. IPROPI feedback is inaccurate. ITRIP regulation levels, if enabled, will be lower. | B |
| SDO | nFAULT | False fault signaling possible. SPI communication will be affected during fault assertion. | B |
| SDI | SDO | SPI communication is lost. | B |
| Pin | Description of Potential Failure Effect(s) | Failure Effect Class | |
|---|---|---|---|
| No. | Name | ||
| 1 | SCLK | Device damage possible. | A |
| 2 | nSCS | Device damage possible. | A |
| 3 | IN | Device damage possible. | A |
| 4 | DRVOFF | OUT is Hi-Z. | B |
| 5 | VCP | Pull up path RON (High-side FET) will be much higher. | B |
| 6, 7, 8, 21, 22, 23 | VM | Normal function. | D |
| 9, 10, 11, 18, 19, 20 | OUT | If OUT is commanded to be pulled low, short is detected and OUT is Hi-Z. | B |
| 12, 13, 14, 15, 16, 17 | GND | Device is powered off with driver Hi-Z. | B |
| 24 | nSLEEP | Device damage possible. | A |
| VDD | Device damage possible. | A | |
| 25 | IPROPI | Device damage possible. | A |
| 26 | nFAULT | Device damage possible. | A |
| 27 | SDO | Device damage possible. | A |
| 28 | SDI | Device damage possible. | A |