SFFS068 March 2021 TLIN2021A-Q1
The failure mode distribution estimation for the TLIN2021A-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| LIN Transmitter failure | 43% |
| LIN Receiver failure | 4% |
| High Voltage I/O failure | 13% |
| Digital logic + I/O buffers failure | 10% |
| Global power management + state control failure | 30% |