SFFS086 August 2021 TLIN1039-Q1

4 Pin Failure Mode Analysis (Pin FMA)

This section provides a Failure Mode Analysis (FMA) for the pins of the TLIN1039-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:

Pin short-circuited to Ground (see Table 4-2)
Pin open-circuited (see Table 4-3)
Pin short-circuited to an adjacent pin (see Table 4-4)
Pin short-circuited to supply (see Table 4-5)

Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.

Table 4-1 TI Classification of Failure Effects

Class	Failure Effects
A	Potential device damage that affects functionality
B	No device damage, but loss of functionality
C	No device damage, but performance degradation
D	No device damage, no impact to functionality or performance

Figure 4-1 shows the device pin diagram. For a detailed description of the device pins, please refer to the Pin Configuration and Functions section in the TLIN1039-Q1 data sheet.

Figure 4-1 DDF Pin Diagram

Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:

All conditions within the recommended operating conditions highlighted in datasheet.

Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground

Pin Name	Pin No.	Description of Potential Failure Effect(s)	Failure Effect Class
RXD	1	RXD biased dominant, no communication from LIN bus to MCU possible	B
EN	2	Device may only operate in Standby Mode after power-on. If short occurs in Normal mode, the part would be forced to enter sleep mode and could disable LIN communication	B
NC	3	No impact to performance	D
TXD	4	TXD biased dominant, no communication from MCU to LIN bus possible	B
GND	5	None	D
LIN	6	LIN biased dominant, no LIN communication possible	B
V_SUP	7	Device is unpowered and will not function	B
NC	8	No impact to performance	D

Table 4-3 Pin FMA for Device Pins Open-Circuited

Pin Name	Pin No.	Description of Potential Failure Effect(s)	Failure Effect Class
RXD	1	No communication from LIN bus to MCU possible	B
EN	2	Biased low due to internal pull-down, so device in standby mode	B
NC	3	No impact to performance	D
TXD	4	No communication from MCU to LIN bus possible	B
GND	5	Device is unpowered and will not function	B
LIN	6	No LIN communication possible	B
V_SUP	7	Device is unpowered and will not function	B
NC	8	No impact to performance	D

Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin

Pin Name	Pin No.	Shorted to	Description of Potential Failure Effect(s)	Failure Effect Class
RXD	1	EN	Device will go into sleep mode when a dominant bit is received on the LIN bus, disabling communication	B
EN	2	NC	No impact to performance	D
NC	3	TXD	No impact to performance	D
GND	5	LIN	LIN biased dominant, no LIN communication possible	B
LIN	6	V_SUP	LIN biased recessive, no LIN communication possible	B
V_SUP	7	NC	No impact to performance	D

Table 4-5 Pin FMA for Device Pins Short-Circuited to V_SUP supply

Pin Name	Pin No.	Description of Potential Failure Effect(s)	Failure Effect Class
RXD	1	Absolute maximum voltage violation, transceiver may be damaged	A
EN	2	Absolute maximum voltage violation, transceiver may be damaged	A
NC	3	No impact to performance	D
TXD	4	Absolute maximum voltage violation, transceiver may be damaged	A
GND	5	Device is unpowered and will not function. High current drawn from V_SUP source.	B
LIN	6	LIN biased recessive, no LIN communication possible	B
V_SUP	7	None	D
NC	8	No impact to performance	D