SFFS099 April 2021 ISO6741 , ISO6741-Q1
4.1 16-DW (wide-body SOIC) Package
Figure 4-1 shows the ISO6741/ISO6741-Q1 and ISO6741F/ISO6741F-Q1 pin diagram for the 16-DW package. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the ISO6741/ISO6741-Q1 data sheet.
Figure 4-1 Pin DiagramTable 4-2 Pin FMA for Device Pins
Short-Circuited to Ground
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| VCC1 | 1 | No power to the device on side-1. Observe that the absolute maximum ratings for all pins of the device are met; otherwise device damage may be plausible. OUTD state undetermined. | A |
| GND1 | 2 | Device continues to function as expected. | D |
| INA | 3 | Input signal shorted to ground, so output (OUTA) stuck to low. Communication from INA to OUTA corrupted. | B |
| INB | 4 | Input signal shorted to ground, so output (OUTB) stuck to low. Communication from INB to OUTB corrupted. | B |
| INC | 5 | Input signal shorted to ground, so output (OUTC) stuck to low. Communication from INC to OUTC corrupted. | B |
| OUTD | 6 | OUTD stuck low. Data communication from IND to OUTD lost. Device damage possible if IND is driven high for extended period of time. | A |
| EN1 | 7 | Disables output buffer for OUTD. Communication corrupted for Channel D. | B |
| GND1 | 8 | Device continues to function as expected. Normal operation. | D |
| GND2 | 9 | Device continues to function as expected. Normal operation. | D |
| EN2 | 10 | Disables the output buffer for OUTA/OUTB/OUTC channels. Communication corrupted. | B |
| IND | 11 | Input signal shorted to ground, so output (OUTD) stuck to low. Communication from IND to OUTD corrupted. | B |
| OUTC | 12 | OUTC stuck low. Data communication from INC to OUTC lost. Device damage possible if INC is driven high for extended period of time. | A |
| OUTB | 13 | OUTB stuck low. Data communication from INB to OUTB lost. Device damage possible if INB is driven high for extended period of time. | A |
| OUTA | 14 | OUTA stuck low. Data communication from INA to OUTA lost. Device damage possible if INA is driven high for extended period of time. | A |
| GND2 | 15 | Device continues to function as expected. Normal operation. | D |
| VCC2 | 16 | No power to the device on side-2. OUTA/OUTB/OUTC pins state undetermined. | B |
Table 4-3 Pin FMA for Device Pins
Open-Circuited
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| VCC1 | 1 | Operation undetermined. Either device is unpowered and OUTA/OUTB/OUTC=default logic state, OUTD=undetermined or through internal ESD diode on INA/INB/INC pin, device can power up if any IN is driven to logic high. If IN has current sourcing capability to provide regular operating current of device, ESD diode conducts that current and device damage plausible. | A |
| GND1 | 2 | Device gets return ground through pin8. Normal operation. | D |
| INA | 3 | No communication to INA channel possible. OUTA stuck to default state (High for ISO6741/ISO6741-Q1 and Low for ISO6741F/ISO6741F-Q1). | B |
| INB | 4 | No communication to INB channel possible. OUTB stuck to default state (High for ISO6741/ISO6741-Q1 and Low for ISO6741F/ISO6741F-Q1). | B |
| INC | 5 | No communication to INC channel possible. OUTC stuck to default state (High for ISO6741/ISO6741-Q1 and Low for ISO6741F/ISO6741F-Q1). | B |
| OUTD | 6 | State of OUTD undetermined. Data communication from IND to OUTD lost. | B |
| EN1 | 7 | Control on OUTD output buffer lost, but communication from IN to OUT channels continues normally. | B |
| GND1 | 8 | Device gets return ground through pin2. Normal operation. | D |
| GND2 | 9 | Device gets return ground through pin15. Normal operation. | D |
| EN2 | 10 | Control on OUTA/OUTB/OUTC output buffer lost, but communication from IN to OUT channels continues normally. | B |
| IND | 11 | No communication to IND channel possible. OUTD stuck to default state (High for ISO6741/ISO6741-Q1 and Low for ISO6741F/ISO6741F-Q1). | B |
| OUTC | 12 | State of OUTC undetermined. Data communication from INC to OUTC lost. | B |
| OUTB | 13 | State of OUTB undetermined. Data communication from INB to OUTB lost. | B |
| OUTA | 14 | State of OUTA undetermined. Data communication from INA to OUTA lost. | B |
| GND2 | 15 | Device gets return ground through pin9. Normal operation. | D |
| VCC2 | 16 | Device unpowered on side-2 and state of OUTA/OUTB/OUTC undetermined. | B |
Table 4-4 Pin FMA for Device Pins
Short-Circuited to Adjacent Pin
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|---|
| VCC1 | 1 | GND1 | No power to the device on side-1. Observe that the absolute maximum ratings for all pins of the device are met; otherwise device damage may be plausible. | A |
| GND1 | 2 | INA | Input signal shorted to ground, so output (OUTA) stuck to low. Communication from INA to OUTA corrupted. | B |
| INA | 3 | INB | Communication corrupted for either INA or INB channel. | B |
| INB | 4 | INC | Communication corrupted for either INA or INB channel. | B |
| INC | 5 | OUTD | Communication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. | A |
| OUTD | 6 | EN1 | Communication corrupted on Channel D. If EN1 is pulled to supply externally, possible device damage if OUTD driven low for extended duration. | A |
| EN1 | 7 | GND1 | Disables OUTD output buffer. Communication for channel D corrupted. | B |
| GND1 | 8 | EN1 | Already considered in above row. | B |
| GND2 | 9 | EN2 | Disables the output buffer for all OUTA/OUTB/OUTC Output channels. Communication corrupted. | B |
| EN2 | 10 | IND | Communication corrupted on Channel D if EN2 is pulled high or low externally. When IND toggles, communication corrupted on other channels whose output buffer is controlled by EN2. | B |
| IND | 11 | OUTC | Communication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. | A |
| OUTC | 12 | OUTB | Communication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. | A |
| OUTB | 13 | OUTA | Communication corrupted for either OUTA or OUTB channel. Device damage possible if INA and INB try to drive opposite logic state for extended duration creating a short between supply and ground on side-2. | A |
| OUTA | 14 | GND2 | OUTA stuck low. Data communication from INA to OUTA lost. Device damage possible if INA is driven high for extended period of time. | A |
| GND2 | 15 | VCC2 | No power to the device on side-2. OUTA/OUTB/OUTC pins state undetermined. | B |
| VCC2 | 16 | GND2 | Already considered in above row. | B |
Table 4-5 Pin FMA for Device Pins Short-Circuited to
supply
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| VCC1 | 1 | No effect. Normal operation. | D |
| GND1 | 2 | This can create potential difference between pin2 and pin8, causing high current to flow in device and potential device damage. | A |
| INA | 3 | INA pin stuck high. Communication corrupted. OUTA state high. | B |
| INB | 4 | INB pin stuck high. Communication corrupted. OUTB state high. | B |
| INC | 5 | INC pin stuck high. Communication corrupted. OUTC state high. | B |
| OUTD | 6 | OUTD stuck high. Data communication from INC to OUTC lost. Device damage possible if IND is driven low for extended period of time. | A |
| EN1 | 7 | Functionality to disable output buffer OUTD lost. Communication for all channels normal. | B |
| GND1 | 8 | This can create potential difference between pin2 and pin8, causing high current to flow in device and potential device damage. | A |
| GND2 | 9 | This can create potential difference between pin9 and pin15, causing high current to flow in device and potential device damage. | A |
| EN2 | 10 | Functionality to disable output buffer for OUTA/OUTB/OUTC lost. Communication for all channels normal. | B |
| IND | 11 | IND pin stuck high. Communication corrupted. OUTD state high. | B |
| OUTC | 12 | OUTC stuck high. Communication disrupted. If INC is low for extended duration, OUTC being stuck high creates a short and can damage the device. | A |
| OUTB | 13 | OUTB stuck high. Communication disrupted. If INB is low for extended duration, OUTB being stuck high creates a short and can damage the device. | A |
| OUTA | 14 | OUTA stuck high. Communication disrupted. If INA is low for extended duration, OUTA being stuck high creates a short and can damage the device. | A |
| GND2 | 15 | This can create potential difference between pin9 and pin15, causing high current to flow in device and potential device damage. | A |
| VCC2 | 16 | Device continues to function as expected. Normal operation. | D |