SFFS103 June 2021 TPS3710-Q1
4 Pin Failure Mode Analysis (Pin FMA)
This section provides a Failure Mode Analysis (FMA) for the pins of the TPS3710-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
- Pin short-circuited to Ground (see Table 4-2)
- Pin open-circuited (see Table 4-3)
- Pin short-circuited to an adjacent pin (see Table 4-4)
- Pin short-circuited to VDD (see Table 4-5)
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
| Class | Failure Effects |
|---|---|
| A | Potential device damage that affects functionality |
| B | No device damage, but loss of functionality |
| C | No device damage, but performance degradation |
| D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the TPS3710-Q1 pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TPS3710-Q1 data sheet.
Figure 4-1 DSE PackageWSON-6Top ViewFollowing are the assumptions of use and the device configuration assumed for the pin FMA in this section:
- Unless otherwise specified, it is assumed that the voltages applied to all the pins are within the Recommended Operating Range specified in the TPS3710-Q1 data sheet.
- Note that the SENSE pin has lower maximum operating range than VDD and OUT.
- For shorts to VDD, this document assumes the SENSE pin maximum is not exceeded.
- Refer to Typical Application Circuit diagram in the datasheet for test layout.
| Pin Name | Pin No. (DSE) | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| GND | 1 | No effect. | D |
| VDD | 2 | No damage to device, but device is unpowered. Device is nonfunctional. | B |
| GND | 3 | No effect. | D |
| SENSE | 4 | No damage to device, output always low. | B |
| GND | 5 | No effect. | D |
| OUT | 6 | No damage to device, output pin nonfunctional, increase in system current. | B |
| Pin Name | Pin No. (DSE) | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| GND | 1 | No effect if at least one other GND pin is connected to GND. | D |
| VDD | 2 | No damage to device, but device is unpowered. Device is nonfunctional. | B |
| GND | 3 | No effect if at least one other GND pin is connected to GND. | D |
| SENSE | 4 | No damage to device. Due to internal resistor ladder for setting trip points open SENSE pin behaves as though GND potential - output always low. | B |
| GND | 5 | No effect if at least one other GND pin is connected to GND. | D |
| OUT | 6 | No damage to device, output pin nonfunctional. | B |
| Pin Name | Pin No. (DSE) | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|---|
| GND | 1 | OUT | No damage to device, output pin nonfunctional, increase in system current. | B |
| VDD | 2 | GND | No damage to device, but device is unpowered. Device is nonfunctional. | B |
| GND | 3 | VDD | No damage to device, but device is unpowered. Device is nonfunctional. | B |
| SENSE | 4 | GND | No damage to device, output always low. | B |
| GND | 5 | SENSE | No damage to device, output always low. | B |
| OUT | 6 | GND | No damage to device, output pin nonfunctional, increase in system current. | B |
| Pin Name | Pin No. (DSE) | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| GND | 1 | No damage to device, but device is unpowered. Device is nonfunctional. | B |
| VDD | 2 | No effect. | D |
| GND | 3 | No damage to device, but device is unpowered. Device is nonfunctional. | B |
| SENSE | 4 | No damage to device, output always active. | B |
| GND | 5 | No damage to device, but device is unpowered. Device is nonfunctional. | B |
| OUT | 6 | No damage to device, output pin nonfunctional. | B |