1 Overview

This document contains information for TCAN11623-Q1 and TCAN11625-Q1 (DTM package) to aid in a functional safety system design. Information provided are:

Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
Component failure modes and their distribution (FMD) based on the primary function of the device
Pin failure mode analysis (Pin FMA)

Figure 1-1 and Figure 1-2 shows the device functional block diagram for reference.

WUP = Wake-up pattern

Figure 1-1 Functional Block Diagram (TCAN11623-Q1)

WUP = Wake-up pattern

Figure 1-2 Functional Block Diagram (TCAN11625-Q1)

The TCAN11623-Q1 and TCAN11625-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.