SFFS146 November 2021 TCAN11623-Q1 , TCAN11625-Q1
Figure 4-1 shows the TCAN11623-Q1 pin diagram for the DMT package. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TCAN11623-Q1 data sheet.
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| TXD | 1 | Device will enter dominant timeout mode. Unable to transmit data from processor to CAN bus | B |
| GND | 2 | None | D |
| VFLT | 3 | Internal power rail held to ground, which results in unpowered device and high ISUP current. No communication with device or CAN bus possible | B |
| RXD | 4 | Transceiver output biased dominant. Unable to send data from CAN bus to processor | B |
| VIO | 5 | Digital pins unpowered, high IIO current. No communication between device and processor possible | B |
| TS | 6 | Transceiver status output held at ground. Unable to signal ready transceiver to processor | B |
| INH | 7 | INH will not function, excessive VSUP current and not able to perform power enable function | B |
| VLDO3 | 8 | Shorting LDO output to ground could cause device to enter thermal shutdown due to short circuit current. | B |
| WAKE | 9 |
Will not be able to transition to high, which will not allow device to recognize a local wake up function | B |
| VSUP | 10 | Device unpowered, high ISUP current | B |
| nRST | 11 | Device held in reset. No communication with device or CAN bus possible | B |
| CANL | 12 | VO(REC) spec violated. Degraded EMC performance | C |
| CANH | 13 | Device cannot drive dominant to the bus, no communication possible | B |
| nSLP | 14 | Part held in sleep mode. Part will not wake up, resulting in CAN bus communication failure | B |
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| TXD | 1 | Unable to trtansmit data from processor to CAN bus | B |
| GND | 2 | Device is unpowered | B |
| VFLT | 3 | Degraded EMC performance due to no capacitance | C |
| RXD | 4 | Unable to send data from CAN bus to processor | B |
| VIO | 5 | Digital pins unpowered. No communication between device and processor possible | B |
| TS | 6 | Transceiver status output held at ground. Unable to signal ready transceiver to processor | B |
| INH | 7 | INH will not be able to perform system power enable functrion | B |
| VLDO3 | 8 | Open circuit on LDO could cause devices relying on this 3.3 V supply to go unpowered | B |
| WAKE | 9 | Will not be able to transition, which will not allow device to recognize a local wake up function | B |
| VSUP | 10 | Device is unpowered | B |
| nRST | 11 | Processor will be unable to reset the device. | B |
| CANL | 12 | Device cannot drive dominant to the bus, unable to communicate | B |
| CANH | 13 | Device cannot drive dominant to the bus, unable to communicate | B |
| nSLP | 14 | Processor will be unable to put the device into low-power sleep mode | B |
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|---|
| TXD | 1 | GND | Device will enter dominant time out mode. Unable to transmit data from processor to CAN bus | B |
| GND | 2 | VFLT | Internal power rail held to ground, which results in unpowered device and high ISUP current. No communication with device or CAN bus possible. | B |
| VFLT | 3 | RXD | RXD output biased recessive, unable to communication bus data to processor | B |
| RXD | 4 | VIO | RXD output biased recessive, unable to communication bus data to processor | B |
| VIO | 5 | TS | Transceiver status output held at VIO. Unable to signal ready transceiver to processor | B |
| TS | 6 | INH | Absolute maximum violation, pin may be damaged. Unable to communicate from transceiver status to processor | A |
| VLDO3 | 8 | WAKE | Device will wake itself when transitioned to sleep mode, as supply is powered down. | B |
| WAKE | 9 | VSUP | Absolute maximum violation, WAKE pin may be damaged | A |
| VSUP | 10 | nRST | Absolute maximum violation, nRST pin may be damaged | A |
| nRST | 11 | CANL | Device would be reset every time bus is dominant. No communication possible | B |
| CANL | 12 | CANH | Bus biased recessive, no communication possible. IOS current may be reached on CANH/CANL | B |
| CANH | 13 | nSLP | Device could be put to sleep when bus is recessive. No communication possible | B |
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| TXD | 1 |
Absolute maximum violation, pin may be damaged. Unable to communicate from processor to CAN bus | A |
| GND | 2 | Device unpowered, high ISUP current, may damage device | A |
| VFLT | 3 | Absolute maximum violation, device may be damaged. | A |
| RXD | 4 | Absolute maximum violation, pin may be damaged. Unable to communicate from CAN bus to processor | A |
| VIO | 5 | Absolute maximum violation, pin may be damaged. | A |
| TS | 6 | Absolute maximum violation, pin may be damaged. | A |
| INH | 7 | INH will be biased on and will not be able to turn off | B |
| VLDO3 | 8 | Absolute maximum violation, device may be damaged. | A |
| WAKE | 9 | Processor will be unable to toggle wake pin. No local wake possible. | B |
| VSUP | 10 | None | D |
| nRST | 11 | Absolute maximum violation, pin may be damaged. | A |
| CANL | 12 |
RXD biased recessive, no communication from CAN bus to processor possible. IOS current may be reached |
B |
| CANH | 13 | VO(REC) spec violated. May degrade EMC performance | C |
| nSLP | 14 | Absolute maximum violation, pin may be damaged. | A |
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| TXD | 1 | TXD will be held high, no communication from processor to CAN bus possible | B |
| GND | 2 | Device unpowered, high VLDO3 current, may enter thermal shutdown | B |
| VFLTR | 3 | Excessive current from internal rail, may enter thermal shutdown | B |
| RXD | 4 | RXD will be held high, no communication from CAN bus to processor possible | B |
| VIO | 5 | Potential for high VCCOUT current, may enter thermal shutdown | B |
| TS | 6 | Held high, unable to signal transceiver state to processor | B |
| INH | 7 | Absolute maximum violation, device may be damaged | A |
| VLDO3 | 8 | None | D |
| WAKE | 9 | Processor will be unable to toggle wake pin. No local wake possible | B |
| VSUP | 10 | Absolute maximum violation, device may be damaged | A |
| nRST | 11 | Held high, unable to reset processor | B |
| CANL | 12 | RXD biased recessive, no communication from CAN bus to processor possible. IOS current may be reached | B |
| CANH | 13 | VO(REC) spec violated. May degrade EMC performance | C |
| nSLP | 14 | Held high, unable to put device to sleep | B |
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| TXD | 1 | TXD will be held high, no communication from processor to CAN bus possible | B |
| GND | 2 | Device unpowered, communication not possible | B |
| VFLTR | 3 | Excessive current from internal rail, may enter thermal shutdown | B |
| RXD | 4 | RXD will be held high, no communication from CAN bus to processor possible | B |
| VIO | 5 | None | D |
| TS | 6 | Held high, unable to signal transceiver state to processor | B |
| INH | 7 | Absolute maximum violation, device may be damaged | A |
| VLDO3 | 8 | Excessive current from VLDO3, may enter thermal shutdown | B |
| WAKE | 9 | Processor will be unable to toggle wake pin. No local wake possible | B |
| VSUP | 10 | Absolute maximum violation, device may be damaged | A |
| nRST | 11 | Held high, unable to reset processor | B |
| CANL | 12 | RXD biased recessive, no communication from CAN bus to processor possible. IOS current may be reached | B |
| CANH | 13 | VO(REC) spec violated. May degrade EMC performance | C |
| nSLP | 14 | Held high, unable to put device to sleep | B |