SFFS177 October   2021 TCAN1046A-Q1 , TCAN1046AV-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
  6. 5Revision History

Overview

This document contains information for TCAN1046A-Q1 and TCAN1046AV-Q1 (VSON, SOIC, and SOT packages) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 shows the TCAN1046A-Q1 functional block diagram for reference. Figure 1-2 shows the TCAN1046AV-Q1 functional block diagram for reference.

GUID-08A42F0F-695D-4DC4-AC4E-A9F83000CA99-low.gif Figure 1-1 TCAN1046A-Q1 Functional Block Diagram
GUID-20210624-CA0I-H72J-CWJW-RCKRZBN8SWFG-low.jpg Figure 1-2 TCAN1046AV-Q1 Functional Block Diagram

TCAN1046A-Q1 and TCAN1046AV-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.