SFFS181 June 2021 LM5145-Q1
The failure mode distribution estimation for LM5145-Q1 in Table 2-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
HO or LO gate driver stuck off | 20% |
HO or LO output not in specification – voltage or timing | 45% |
Ho or LO gate driver open – high Z | 10% |
HO or LO gate driver stuck on | 20% |
PGOOD false trip, fails to trip | 5% |
The FMD in excludes short circuit faults across the isolation barrier. Faults for short circuit across the isolation barrier can be excluded according to ISO 61800-5-2:2016 if the following requirements are fulfilled:
Creepage and clearance requirements should be applied according to the specific equipment isolation standards of an application. Care should be taken to maintain the creepage and clearance distance of a board design to ensure that the mounting pads of the isolator on the printed-circuit board do not reduce this distance.