Selected on-chip SRAMs support SECDED ECC diagnostic with separate ECC bits for data and address. For the specific address ranges that support ECC, see the TMS320F280015x MCU device-specific data sheet. In SECDED scheme, a 21-bit code word is used to store the ECC data calculated independently for each 16 bit of data and for address. The ECC logic for the SRAM access is located in the SRAM wrapper. The ECC is evaluated directly at the memory output and data is sent to CPU after the data integrity check. The data and address interconnects from SRAM to the CPU is not protected using ECC. Detected correctable errors are corrected and it is possible to monitor the number of corrected errors. The SRAM wrapper can be configured to trigger an interrupt once the number of corrected errors crosses a threshold. Uncorrectable SRAM errors trigger an NMI and the ERRORSTS pin is asserted. The ECC logic for the SRAM is enabled at reset. For more information regarding memories supporting ECC, see the TMS320F280015x MCU device-specific data sheet.