The SRAM modules implemented in the TMS320F280015x MCU device family have a bit multiplexing scheme implemented such that the bits accessed to generate a logical (CPU) word are not physically adjacent. This scheme helps to reduce the probability of physical multi-bit faults resulting in logical multi-bit faults. Rather, they manifest as multiple single bit faults. The SECDED SRAM ECC diagnostic can correct a single bit fault and detect double bit fault in a logical word. Similarly, the SRAM parity diagnostic can detect single bit faults. This scheme improves the usefulness of the SRAM ECC and parity diagnostic. Bit multiplexing is a feature of the SRAM and cannot be modified by the software.