SFFS227 August 2021 TPSM5601R5H , TPSM5601R5HE
1 Overview
This document contains information for TPSM5601R5H, TPSM5601R5HE, and TPSM5601R5HS (B3QFN package) to aid in a functional safety system design. Information provided are:
- Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
- Component failure modes and their distribution (FMD) based on the primary function of the device
- Pin failure mode analysis (Pin FMA)
Figure 1-1 shows the device functional block diagram for reference.
Figure 1-1 Functional Block
DiagramTPSM5601R5H, TPSM5601R5HE, and TPSM5601R5HS were developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.