SFFS230 August 2021 TLV3603-Q1
Figure 4-1 shows the TLV3603-Q1 pin diagram for the DCK package. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TLV3603-Q1 data sheet.
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
OUT |
1 | Thermal stress due to high power dissipation |
A |
VEE |
2 | No change if same node as GND |
D |
IN+ | 3 | Output goes low, if other input is positive | B |
IN- | 4 | Output goes high, if other input is positive | B |
LE /HYST | 5 | Output may be low or high | B |
VCC | 6 | Main supply shorted out (no power to device) | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
OUT | 1 | Output can't drive application load | B |
VEE | 2 | Lowest voltage pin will drive GND pin internally (via diode) | A |
IN+ | 3 | Output may be low or high | B |
IN- | 4 | Output may be low or high | B |
LE /HYST | 5 | Output may be low or high | C |
VCC | 6 | Main supply open (no power to device) | B |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|---|
OUT |
1 |
VEE |
Thermal stress due to high power dissipation |
A |
VEE |
2 |
IN+ |
Output goes low, if other input is positive |
B |
IN+ |
3 |
IN- |
Output may be low or high |
B |
IN- |
4 |
LE /HYST |
Output may be low or high |
C |
LE /HYST |
5 |
VCC |
Output may be low or high |
C |
VCC |
6 |
OUT |
Thermal stress due to high power dissipation |
A |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
OUT | 1 | Thermal stress due to high power dissipation | A |
VEE | 2 | Main supply shorted out (no power to device) | B |
IN+ | 3 | Output goes high, if other input is less positive | B |
IN- | 4 | Output goes low, if other input is less positive | B |
LE /HYST | 5 | Output may be low or high | C |
VCC | 6 | No change if same node as VCC | D |