SFFS252 august 2023 TLV1851 , TLV1851-Q1 , TLV1861 , TLV1861-Q1
1 Overview
This document contains information for TLV185x-Q1 and TLV186x-Q1 (single and dual channel devices) to aid in a functional safety system design. Information provided are:
- Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
- Component failure modes and their distribution (FMD) based on the primary function of the device
- Pin failure mode analysis (Pin FMA)
Figure 1-1 shows the device functional block diagram for reference.
Figure 1-1 Functional Block DiagramTLV185x-Q1 and TLV186x-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.