SFFS273 December 2021 LMK00804B-Q1
The failure mode distribution estimation for the LMK00804B-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| Incorrect input selected | 60 |
| Performance degradation of output clocks | 40 |