SFFS285 January 2024 LM74701-Q1
The failure mode distribution estimation for LM74701-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| Cathode to Anode Clamp (VCLAMP) Voltage not in specification | 15% |
GATE output voltage or timing not in specification | 40% |
GATE stuck at lower voltage | 40% |
| Pin to pin short | 5% |