SFFS286 September 2021 TLVH431B-Q1
The failure mode distribution estimation for the TLVH431B-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| Cathode or Anode open (HIZ) | 25 |
| Cathode to Anode short | 35 |
| Cathode not in specification voltage or current | 40 |