SFFS297 December 2021 AMC1350-Q1
This section provides a failure mode analysis (FMA) for the pins of the AMC1350-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality. |
B | No device damage, but loss of functionality. |
C | No device damage, but performance degradation. |
D | No device damage, no impact to functionality or performance. |
Figure 4-1 shows the AMC1350-Q1 pin diagram. For a detailed description of the device pins, see the Pin Configuration and Functions section in the AMC1350-Q1 data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
VDD1 | 1 | Device primary side unpowered. Fail-safe output (see data sheet for more details). Observe that the absolute maximum ratings for the INP and INN pins of the device are met, otherwise device damage may be plausible. | A |
INP | 2 | INP stuck low (GND1). Differential output (VOUTP – VOUTN) = 0 V with common-mode voltage approximately 1.44 V. | B |
INN | 3 | INN stuck low (GND1). Differential output (VOUTP – VOUTN) = VINP × 0.4 with common-mode voltage approximately 1.44 V. Normal operation for the assumed use case. | D |
GND1 | 4 | No effect. Normal operation. | D |
GND2 | 5 | No effect. Normal operation. | D |
OUTN | 6 | OUTN stuck low (GND2). Excess current consumption from VDD2 source because of short-circuit condition. Device damage plausible if condition is present for extended period of time. | A |
OUTP | 7 | OUTP stuck low (GND2). Excess current consumption from VDD2 source because of short-circuit condition. Device damage plausible if condition is present for extended period of time. | A |
VDD2 | 8 | Device secondary side unpowered. OUTP and OUTN pins are driven to GND2. | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
VDD1 | 1 | Device primary side unpowered. Fail-safe output (see data sheet for more details). | B |
INP | 2 | Differential output (VOUTP – VOUTN) undetermined. | B |
INN | 3 | Differential output (VOUTP – VOUTN) undetermined. | B |
GND1 | 4 | Device high side unpowered. Fail-safe output (see data sheet for more details). | B |
GND2 | 5 | Device behavior undetermined. VOUTN and VOUTP undetermined. | B |
OUTN | 6 | Differential output (VOUTP – VOUTN) undetermined. | B |
OUTP | 7 | Differential output (VOUTP – VOUTN) undetermined. | B |
VDD2 | 8 | Device secondary side unpowered. OUTP and OUTN pins are driven to GND2. | B |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|---|
VDD1 | 1 | INP | INP stuck high (VDD1). Differential output (VOUTP – VOUTN) = VCLIPout. See data sheet for details. | B |
INP | 2 | INN | Differential input shorted. Differential output (VOUTP – VOUTN) = 0 V. | B |
INN | 3 | GND1 | INN stuck low (GND1). Differential output (VOUTP – VOUTN) = VINP × 0.4 with common-mode voltage approximately 1.44 V. Normal operation for the assumed use case. | D |
GND1 | 4 | GND2 | Not considered. Corner pin. | D |
GND2 | 5 | OUTN | OUTN stuck low (GND2). Excess current consumption from VDD2 source because of short-circuit condition. Device damage plausible if condition is present for extended period of time. | A |
OUTN | 6 | OUTP | Differential output (VOUTP – VOUTN) = 0 V with common-mode voltage approximately 1.44 V. Excess current consumption from VDD2 source. Device damage plausible if condition is present for extended period of time. | A |
OUTP | 7 | VDD2 | OUTP stuck high (VDD2). Excess current consumption from VDD2 source. Device damage plausible if condition is present for extended period of time. | A |
VDD2 | 8 | VDD1 | Not considered. Corner pin. | D |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
VDD1 | 1 | No effect. Normal operation. | D |
INP | 2 | INP stuck high (VDD1). Differential output (VOUTP – VOUTN) = VCLIPout. See data sheet for details. | B |
INN | 3 | INN stuck high (VDD1). Differential output (VOUTP – VOUTN) incorrect. | B |
GND1 | 4 | Device primary side unpowered. Fail-safe output (see data sheet for details). Observe that the absolute maximum ratings for INP and INN of the device are met, otherwise device damage may be plausible. | A |
GND2 | 5 | Device secondary side unpowered. OUTP and OUTN pins are driven to GND2. | B |
OUTN | 6 | OUTN stuck high (VDD2). Excess current consumption from VDD2 source. Device damage plausible if condition is present for extended period of time. | A |
OUTP | 7 | OUTP stuck high (VDD2). Excess current consumption from VDD2 source. Device damage plausible if condition is present for extended period of time. | A |
VDD2 | 8 | No effect. Normal operation. | D |