SFFS379A September 2022 – March 2023 TLV766-Q1
This section provides functional safety failure in time (FIT) rates for the TLV766-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total component FIT rate | 10 |
Die FIT rate | 6 |
Package FIT rate | 4 |
The failure rate and mission profile information in #GUID-DCF3AEF0-70D2-4927-9704-A593676BEEFE/GUID-D2F32BF7-F0F2-45BD-945E-5E9A117DF52F comes from the reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS, BICMOS Digital, analog, or mixed |
25 FIT | 55°C |
The reference FIT rate and reference virtual TJ (junction temperature) in #GUID-DCF3AEF0-70D2-4927-9704-A593676BEEFE/GUID-F6448F76-6F1A-4872-8629-AFB15459B793 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.