SFFS400 March 2022 TPS3760-Q1
This section provides a Failure Mode Analysis (FMA) for the pins of the TPS3760-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Table 4-1 shows the TPS3760-Q1 pin diagram. For a detailed description of the device pins please refer to TPS3760-Q1 in the Pin Configuration and Functions section of the data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
PIN NAME | PIN NO. | DESCRIPTION OF POTENTIAL FAILURE EFFECT(S) | FAILURE EFFECT CLASS |
---|---|---|---|
VDD | 1 |
VDD short to GND, Device has no power for normal operation |
B |
NC |
2 | Normal operation, Pin is not connected during normal operation | D |
SENSE | 3 | Functionality affected, Voltage threshold will not be intended threshold | B |
NC | 4 | Normal operation, Pin is not connected during normal operation | D |
NC | 5 | Normal operation, Pin is not connected during normal operation | D |
RESET |
6 | Functionality affected, Unreliable device output | A |
NC |
7 | Normal operation, Pin is not connected during normal operation | D |
GND | 8 | Normal operation | D |
CTR | 9 | RESET will be asserted. | B |
CTS | 10 | Normal operation, RESET will be asserted | B |
NC |
11 |
Normal operation, Pin is not connected during normal operation | D |
NC |
12 |
Normal operation, Pin is not connected during normal operation | D |
GND |
13 |
Normal operation | D |
NC |
14 |
Normal operation, Pin is not connected during normal operation | D |
PIN NAME | PIN NO. | DESCRIPTION OF POTENTIAL FAILURE EFFECT(S) | FAILURE EFFECT CLASS |
---|---|---|---|
VDD | 1 | Device Unpowered | B |
NC |
2 | Normal operation, Pin is not connected during normal operation | D |
SENSE | 3 | Functionality affected, Voltage threshold will not be intended threshold | B |
NC | 4 | Normal operation, Pin is not connected during normal operation | D |
NC | 5 | Normal operation, Pin is not connected during normal operation | D |
RESET |
6 | Functionality affected, Unreliable device output | A |
NC |
7 | Normal operation, Pin is not connected during normal operation | D |
GND | 8 | Device Unpowered | B |
CTR | 9 | Normal operation | D |
CTS | 10 | Normal operation | D |
NC |
11 |
Normal operation, Pin is not connected during normal operation | D |
NC |
12 |
Normal operation, Pin is not connected during normal operation | D |
GND |
13 |
Device Unpowered | B |
NC |
14 |
Normal operation, Pin is not connected during normal operation | D |
PIN NAME | PIN NO. | SHORTED TO | DESCRIPTION OF POTENTIAL FAILURE EFFECT(S) | FAILURE EFFECT CLASS |
---|---|---|---|---|
VDD | 1 |
NC |
Normal operation | D |
NC |
2 | SENSE | Normal operation | D |
SENSE | 3 | NC | Normal operation | D |
NC | 4 | NC | Normal operation | D |
NC | 5 |
RESET |
Normal operation | D |
RESET |
6 |
NC |
Functionality affected, Unreliable device output. NC is not connected during normal operation. | B |
NC |
7 | GND | Normal operation | D |
GND | 8 | CTR | Functionality affected, RESET is asserted | B |
CTR | 9 | CTS | Functionality affected, Iq can increase | B |
CTS | 10 | NC | Functionality affected, Iq can increase | B |
NC |
11 |
NC | Functionality affected, Iq can increase | C |
NC |
12 |
GND | Functionality affected, Iq can increase | C |
GND |
13 |
NC |
Normal operation | D |
NC |
14 |
VDD | Normal operation | D |
PIN NAME | PIN NO. | DESCRIPTION OF POTENTIAL FAILURE EFFECT(S) | FAILURE EFFECT CLASS |
---|---|---|---|
VDD | 1 | Normal operation | D |
NC |
2 | Normal operation | D |
SENSE | 3 | Functionality affected, Voltage threshold will not be intended threshold | B |
NC | 4 | Normal operation | D |
NC | 5 | Normal operation | D |
RESET |
6 | Functionality affected, Can cause short from VDD to GND | A |
NC |
7 | Functionality affected, Can cause short from VDD to GND | A |
GND | 8 | VDD short to GND Fault | B |
CTR | 9 | May damage device if VDD is greater than the pin's recommended operating condition | A |
CTS | 10 | May damage device if VDD is greater than the pin's recommended operating condition | A |
NC |
11 |
May damage device if VDD is greater than the pin's recommended operating condition | A |
NC |
12 |
May damage device if VDD is greater than the pin's recommended operating condition | A |
GND |
13 |
VDD short to GND Fault | B |
NC |
14 |
Normal operation | D |