1 Overview

This document contains information for ISO7041/ISO7041-Q1 (16-DBQ packages) to aid in a functional safety system design. Information provided are:

Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
Component failure modes and their distribution (FMD) based on the primary function of the device
Pin failure mode analysis (Pin FMA)

Figure 1-1 shows the device functional block diagram of one channel of ISO7041/ISO7041-Q1 for reference.

Figure 1-1 Functional Block Diagram

ISO7041/ISO7041-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.