SFFS542 October 2022 ISO1640-Q1
This section provides Functional Safety Failure In Time (FIT) rates for 8-D package of ISO1640-Q1 based on two different industry-wide used reliability standards:
| FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
|---|---|
| Total Component FIT Rate | 10 |
| Die FIT Rate | 3 |
| Package FIT Rate | 7 |
The failure rate and mission profile information in #GUID-0A7ED846-7EA2-4D7D-8818-0A099F3DA239/GUID-95CB0699-DF24-41B7-9A98-5A8A8866984D comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
| Table | Category | Reference FIT Rate | Reference Virtual TJ |
|---|---|---|---|
| 5 | CMOS, BICMOS Digital, analog / mixed | 25 FIT | 55 °C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in #GUID-0A7ED846-7EA2-4D7D-8818-0A099F3DA239/GUID-91546D77-12B6-4FD3-B7F6-EAB5D6BC5C52 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.