SFFS542 October   2022 ISO1640-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 8-D Package
    2. 2.2 16-DW Package
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 ISO1640-Q1 in 8-D Package
    2. 4.2 ISO1640-Q1 in 16-DW Package

ISO1640-Q1 in 16-DW Package

#GUID-0CFA394A-02FB-4C17-8EB9-D5B503E1523C shows the ISO1640-Q1 pin diagram for the 16-DW package. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the ISO1640-Q1 data sheet.

GUID-20210112-CA0I-JPRH-GMB9-KC2RCV11NTWH-low.gif Figure 4-2 Pin Diagram (16-DW Package)
Table 4-6 Pin FMA for Device Pins Short-Circuited to Ground
Pin Name Pin No. Description of Potential Failure Effect(s) Failure Effect Class
GND1 1 Device continues to function as expected. Normal operation. D
NC 2 Device continues to function as expected. Normal operation. D
VCC1 3 No power to the device on side-1. Observe that the absolute maximum ratings for SDA1/SCL1 are met; otherwise device damage may be plausible. A
NC 4 Device continues to function as expected. Normal operation. D
SDA1 5 SDA1 stuck to low, makes SDA2 also low. Communication corrupted to and from the master node. B
SCL1 6 SCL1 stuck to low, makes SCL2 also low. Communication corrupted to and from the master. B
GND1 7 Device continues to function as expected. Normal operation. D
NC 8 Device continues to function as expected. Normal operation. D
GND2 9 Device continues to function as expected. Normal operation. D
NC 10 Device continues to function as expected. Normal operation. D
SCL2 11 SCL2 stuck low. Data communication from master SCL1 to slave SCL2 lost. Communication corrupted. B
SDA2 12 SDA2 stuck low, makes SDA1 also low. Communication corrupted to and from the master node. B
NC 13 Device continues to function as expected. Normal operation. D
VCC2 14 No power to the device on side-2. Observe that the absolute maximum ratings for SDA2/SCL2 are met; otherwise device damage may be plausible. A
NC 15 Device continues to function as expected. Normal operation. D
GND2 16 Device continues to function as expected. Normal operation. D
Table 4-7 Pin FMA for Device Pins Open-Circuited
Pin NamePin No.Description of Potential Failure Effect(s)Failure Effect Class
GND1 1 Device continues to function as expected. Pin 7 sontinue to function as ground. Normal operation. D
NC 2 Device continues to function as expected. Normal operation. D
VCC1 3 Operation undetermined. Either device is unpowered and SDA2/SCL2 are pulled to logic high to external pull-up resistors or through internal ESD diode on SDA1/SCL1 pin, device can power up if SDA1/SCL1 are logic high. If abs max rating of SDA1/SCL1 is not observed, device damage plausible. A
NC 4 Device continues to function as expected. Normal operation. D
SDA1 5 SDA1 stuck to low, makes SDA2 also low. Communication corrupted to and from the master node. B
SCL1 6 SCL1 stuck to low, makes SCL2 also low. Communication corrupted to and from the master. B
GND1 7 Device continues to function as expected . Pin 1 sontinue to function as ground. Normal operation. D
NC 8 Device continues to function as expected. Normal operation. D
GND2 9 Device continues to function as expected.Pin 16 sontinue to function as ground. Normal operation. D
NC 10 Device continues to function as expected. Normal operation. D
SCL2 11 SCL2 stuck low. Data communication from master SCL1 to slave SCL2 lost. Communication corrupted. B
SDA2 12 SDA2 stuck low, makes SDA1 also low. Communication corrupted to and from the master node. B
NC 13 Device continues to function as expected. Normal operation. D
VCC2 14 No power to the device on side-2. Observe that the absolute maximum ratings for SDA2/SCL2 are met; otherwise device damage may be plausible. A
NC 15 Device continues to function as expected. Normal operation. D
GND2 16 Device continues to function as expected. Pin 1 sontinue to function as ground. Normal operation. D
Table 4-8 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin NamePin No.Shorted toDescription of Potential Failure Effect(s)Failure Effect Class
GND1 1 NC No effect. Normal operation. D
NC 2 VCC1 No effect. Normal operation. D
VCC1 3 NC No effect. Normal operation. D
NC 4 SDA1 No effect. Normal operation. D
SDA1 5 SCL1 I2C Communication corrupted. B
SCL1 6 GND1 SCL1 stuck to low, makes SCL2 also low. Communication corrupted to and from the master. B
GND1 7 NC No effect. Normal operation. D
NC 8 GND1 No effect. Normal operation. D
GND2 9 NC No effect. Normal operation. D
NC 10 SCL2 No effect. Normal operation. D
SCL2 11 SDA2 I2C Communication corrupted. B
SDA2 12 NC No effect. Normal operation. D
NC 13 VCC2 No effect. Normal operation. D
VCC2 14 NC No effect. Normal operation. D
NC 15 GND2 No effect. Normal operation. D
GND2 16 NC No effect. Normal operation. D
Table 4-9 Pin FMA for Device Pins Short-Circuited to supply
Pin NamePin No.Description of Potential Failure Effect(s)Failure Effect Class
GND1 1 Device side-1 unpowered. Observe that the absolute maximum ratings for SCL1/SDA1 pins of the device are met, otherwise device damage may be plausible. A
NC 2 No effect. Normal operation. D
VCC1 3 No effect. Normal operation. D
NC 4 No effect. Normal operation. D
SDA1 5 SDA1 stuck high. Communication corrupted. If SDA2 is driven logic low for extended duration, SDA1 stuck high creates short between supply and ground, possible device damage. A
SCL1 6 SCL1 stuck high does not allow clock transitions to happen. I2C communication corrupted. B
GND1 7 Device side-1 unpowered. Observe that the absolute maximum ratings for SCL1/SDA1 pins of the device are met, otherwise device damage may be plausible. A
NC 8 No effect. Normal operation. D
GND2 9 Device side-2 unpowered. Observe that the absolute maximum ratings for SCL2/SDA2 pins of the device are met, otherwise device damage may be plausible. A
NC 10 No effect. Normal operation. D
SCL2 11 SCL2 stuck high. If SCL1 is driven low for extended duration, SCL2 stuck high creates a path for high current from supply to ground with possible device damage. A
SDA2 12 SDA2 stuck high. Communication corrupted. If SDA1 is driven logic low for extended duration, SDA2 stuck high creates short between supply and ground, possible device damage. A
NC 13 No effect. Normal operation. D
VCC2 14 No effect. Normal operation. D
NC 15 No effect. Normal operation. D
GND2 16 Device side-2 unpowered. Observe that the absolute maximum ratings for SCL2/SDA2 pins of the device are met, otherwise device damage may be plausible. A